JPH0580100B2 - - Google Patents
Info
- Publication number
- JPH0580100B2 JPH0580100B2 JP57071795A JP7179582A JPH0580100B2 JP H0580100 B2 JPH0580100 B2 JP H0580100B2 JP 57071795 A JP57071795 A JP 57071795A JP 7179582 A JP7179582 A JP 7179582A JP H0580100 B2 JPH0580100 B2 JP H0580100B2
- Authority
- JP
- Japan
- Prior art keywords
- objective lens
- probe diameter
- sample
- focal length
- charged particle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 38
- 230000005284 excitation Effects 0.000 claims description 11
- 239000002245 particle Substances 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 9
- 238000010586 diagram Methods 0.000 description 4
- 230000001133 acceleration Effects 0.000 description 3
- 238000010894 electron beam technology Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57071795A JPS58188041A (ja) | 1982-04-27 | 1982-04-27 | 荷電粒子線のプロ−ブ径設定方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57071795A JPS58188041A (ja) | 1982-04-27 | 1982-04-27 | 荷電粒子線のプロ−ブ径設定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58188041A JPS58188041A (ja) | 1983-11-02 |
JPH0580100B2 true JPH0580100B2 (en]) | 1993-11-05 |
Family
ID=13470850
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57071795A Granted JPS58188041A (ja) | 1982-04-27 | 1982-04-27 | 荷電粒子線のプロ−ブ径設定方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58188041A (en]) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2632828B2 (ja) * | 1987-02-17 | 1997-07-23 | 日本電信電話株式会社 | 荷電ビームの自動制御装置 |
JP2636381B2 (ja) * | 1988-11-11 | 1997-07-30 | 日本電子株式会社 | 電子線装置 |
JPH1027563A (ja) * | 1996-07-10 | 1998-01-27 | Jeol Ltd | 走査電子顕微鏡 |
-
1982
- 1982-04-27 JP JP57071795A patent/JPS58188041A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58188041A (ja) | 1983-11-02 |
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